Arrhenius activation energy for Copper and tin migration (in
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Arrhenius activation energy for Copper and tin migration (in

 
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WayneL
Guest





Posted: Fri Feb 18, 2005 3:20 am    Post subject: Arrhenius activation energy for Copper and tin migration (in Reply with quote

Hi

In the electronics industry they use the Arrhenius model for reliability
engineering, esp in migration susceptibility.
One of the figure used in the Arrhenius equation is the activation energy.
They tend to use a figure between 0.5eV and 0.9eV, and seems to be based on
empirical data.
Can anyone help me understand where they may have got these figures e.g. is
it the migration susceptibility of say copper or tin ?
Also, where could I ref. the activation energies for different metal?


Regards


Wayne

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Robert Baer
Guest





Posted: Fri Feb 18, 2005 3:53 am    Post subject: Re: Arrhenius activation energy for Copper and tin migration Reply with quote

WayneL wrote:
Quote:

Hi

In the electronics industry they use the Arrhenius model for reliability
engineering, esp in migration susceptibility.
One of the figure used in the Arrhenius equation is the activation energy.
They tend to use a figure between 0.5eV and 0.9eV, and seems to be based on
empirical data.
Can anyone help me understand where they may have got these figures e.g. is
it the migration susceptibility of say copper or tin ?
Also, where could I ref. the activation energies for different metal?

Regards

Wayne

Perhaps the Chem Rubber handbook might have a table or data on that or
related values.
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WayneL
Guest





Posted: Fri Feb 18, 2005 2:12 pm    Post subject: Re: Arrhenius activation energy for Copper and tin migration Reply with quote

Values in there do not tie up with the value between 0.5eV - 0.9eV (I am
looking at the Work Function)???


Wayne

"Robert Baer" <bobbaer@earthlink.net> wrote in message
news:421512B4.596F3075@earthlink.net...
Quote:
WayneL wrote:

Hi

In the electronics industry they use the Arrhenius model for reliability
engineering, esp in migration susceptibility.
One of the figure used in the Arrhenius equation is the activation
energy.
They tend to use a figure between 0.5eV and 0.9eV, and seems to be based
on
empirical data.
Can anyone help me understand where they may have got these figures e.g.
is
it the migration susceptibility of say copper or tin ?
Also, where could I ref. the activation energies for different metal?

Regards

Wayne

Perhaps the Chem Rubber handbook might have a table or data on that or
related values.


Back to top
Robert Baer
Guest





Posted: Fri Feb 18, 2005 3:10 pm    Post subject: Re: Arrhenius activation energy for Copper and tin migration Reply with quote

WayneL wrote:
Quote:

Values in there do not tie up with the value between 0.5eV - 0.9eV (I am
looking at the Work Function)???

Wayne

"Robert Baer" <bobbaer@earthlink.net> wrote in message
news:421512B4.596F3075@earthlink.net...
WayneL wrote:

Hi

In the electronics industry they use the Arrhenius model for reliability
engineering, esp in migration susceptibility.
One of the figure used in the Arrhenius equation is the activation
energy.
They tend to use a figure between 0.5eV and 0.9eV, and seems to be based
on
empirical data.
Can anyone help me understand where they may have got these figures e.g.
is
it the migration susceptibility of say copper or tin ?
Also, where could I ref. the activation energies for different metal?

Regards

Wayne

Perhaps the Chem Rubber handbook might have a table or data on that or
related values.

I had thought that work functions would seem to be what you could use.
In looking at values, contact potentials are a better "fit".
Also, look at the difference of potential between metals in solution
of salts.
This last one might be considered in relation to a corrosive
environment; moisture and oxygen combined can be considered corrosive.
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Robert Copcutt
Guest





Posted: Sat Feb 19, 2005 5:08 am    Post subject: Re: Arrhenius activation energy for Copper and tin migration Reply with quote

WayneL wrote:
Quote:
Hi

In the electronics industry they use the Arrhenius model for reliability
engineering, esp in migration susceptibility.
One of the figure used in the Arrhenius equation is the activation energy.
They tend to use a figure between 0.5eV and 0.9eV, and seems to be based on
empirical data.
Can anyone help me understand where they may have got these figures e.g. is
it the migration susceptibility of say copper or tin ?
Also, where could I ref. the activation energies for different metal?


http://www.google.co.uk/search?hl=en&q=electromigration+activation+energy&btnG=Search&meta=
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